Handmade quality · Free shipping over $75 · Explore the atelier

D06400 - SEMI D64 - Test Method for Measuring the Spatial Contrast Ratio of Flat Panel Display StdTpc-FPD Substrates NOTICE: This Document was balloted

SKU: 70944283139

4.0
USD193.00 USD237.00

Pay in 4 interest-free payments of $48.25 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Jul 30 - Aug 4

Description

NOTICE: This Document was balloted and approved for withdrawal in 2004

The test is intended to accelerate the corrosion while simulating conditions that may be found within process equipment and gas systems in the semiconductor industry

reference datum

semiconductor manufacturers

D06400 - SEMI D64 - Test Method for Measuring the Spatial Contrast Ratio of Flat Panel Display StdTpc-FPD Substrates NOTICE: This Document was ballotedContrast has a significant influence on the perceived image quality in display devices. For several decades, physical contrast metrics such as contrast ratio (CR) and contrast modulation (CM) have been widely used to quantify the contrast performance of display devices. A robust standardized test method for measuring the average picture level (APL) contrast ratios of flat panel display (FPD) systems is required to enable quality control in high volume

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

You may also like

recommand products