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leaving additional technical issues for future guide upgrades or for implementers’ discretion
This Test Method defines selected terms and a test method for measuring corresponding parameters
This Standard provides guidelines for both the process of developing and delivering equipment training that is performance-based
本スタンダードは，global Silicon Wafer Committeeで技術的に承認されている。現版は2009年9月4日，global Audits and Reviews Subcommitteeにて発行が承認された。2009年10月にwww
E05413 - SEMI E54.13 - EtherNet/IP™用センサ／アクチュエータネットワーク通信の仕様 Lang-Chinese (Traditional) leaving additional technical issues forglobal global Information & Control Committee2011912global Audits and Reviews Subcommittee201110www. semiviews. org www. semi. org20033 SEMI E54 SEMISANEtherNet IP Ethernet Industrial Protocol EtherNet IPEtherNet IPI O EtherNet IPDeviceNet SEMI E54. 4(CIP)EtherNet IP IEEE 802. 3SEMI E54. 4 DeviceNet EtherNet IPEthernetTCP IPCIPEthernetTCP IP EtherNet IP1EtherNet IPCIPIPEtherNet IP EtherNet IPIEEE 802. 3EtherNet IP100Mbps Referenced SEMI Standards SEMI