Spectral Reflectance Film Thickness Measurement System thin-film Replacement Base for 13mm die

Replacement Base for 13mm die set

BLC-20/30 UV Lamp

ic10-applications { display: grid

1 nm Repeatability

Spectral Reflectance Film Thickness Measurement System thin-film Replacement Base for 13mm dieSpectral Reflectance Technology Precision Film Thickness Measurement Non Contact Nanometer to Micrometer Analysis High precision film thickness measurement based on advanced spectral reflectance technology. Enables accurate, non contact measurement from 5 nm to 250 m across semiconductors, photovoltaics, optical coatings, and biomedical applications. Direct replacement for Filmetrics F20 systems. Request Application Study 0. 1 nm Repeatability 5 nm