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resistivity measurements are most reliable when made on single crystals
It includes a specific transfer command state model and transport and storage system controller (TSSC) state model as the basis for all equipment of this class
This Document uses SI units
SEMI M3 — Specifications for Polished Monocrystalline Sapphire Substrates
PV06300 - SEMI PV63 - 光伏组件用超薄玻璃技术规范 Revision:SEMI PV63-0215 - Superseded resistivity measurements are most reliableThis Standard was technically approved by the Photovoltaic Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on November 11, 2014. Available at www. semiviews. org and www. semi. org in February 2015. NOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and
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