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(w/ Analysis Professional Software Suite) PA53MET-T PA53MET-BD PA53MET-BD-3D (w/ Analysis Professional Software Suite) PA53MET-BD-T Main Differences • Reflected Illumination
1 - Flyer Specification sheets
If it is about maximum resolution for printing purposes
Panthera TEC MAT b series Click here to read aThe Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross Polarization contrast are combined with a new, unique to Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects